2014
DOI: 10.1049/el.2014.3443
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Trench SOI LDMOS with vertical field plate

Abstract: A novel vertical field plate (VFP) structure with low specific on-resistance (R on,sp) is proposed. The VFP is inserted in the field oxide of the drift region with heavily doped N pillar parallel to the trench oxide layer (TOL), which depletes fully the drift region to decrease R on,sp effectively and enhances the bulk field (ENBULF). The VFP optimises the bulk electric field to increase the breakdown voltage (BV). The BV of VFP is 668 V with an R on,sp of 44.7 mΩ cm 2 , which is much lower than the silicon li… Show more

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Cited by 17 publications
(8 citation statements)
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References 11 publications
(14 reference statements)
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“…5, With the decrease in ρ RFP , the effect of RFP is enhanced and BV is increased, but I RFP is increased as well. When ρ RFP equals 1×10 9 •cm, the density of the leakage current through RFP (I RFP ) is about 10 −13 A/μm, approximating to the leakage current density of TLD+QVSJ. Hence, in terms of a trade-off between BV and I RFP , ρ RFP is selected to be 1×10 9 •cm.…”
Section: Simulation and Optimizationmentioning
confidence: 99%
See 1 more Smart Citation
“…5, With the decrease in ρ RFP , the effect of RFP is enhanced and BV is increased, but I RFP is increased as well. When ρ RFP equals 1×10 9 •cm, the density of the leakage current through RFP (I RFP ) is about 10 −13 A/μm, approximating to the leakage current density of TLD+QVSJ. Hence, in terms of a trade-off between BV and I RFP , ρ RFP is selected to be 1×10 9 •cm.…”
Section: Simulation and Optimizationmentioning
confidence: 99%
“…Based on the common structure of T-LDMOS, many improved structures are proposed [4]- [12], such as the ones with vertical field plates in the trench [7]- [9], and the ones with variable-k trench-dielectric [10]- [12]. Recently, many studies start applying a well-known technique of super junction (SJ) to the LDMOS [13]- [16], as well as to the T-LDMOS [17]- [20], such as the T-LDMOS with a quasi vertical (QV) SJ structure [17], [19], [20] and that with a lateral SJ structure at the trench bottom [18].…”
Section: Introductionmentioning
confidence: 99%
“…[7][8][9][10][11] State-of-theart LDMOS devices obtained by the dielectric trench to sustain a high reversed voltage have been reported. [12][13][14][15][16][17] In these devices, breakdown occurs in the drift region for the crowded electric field. [18,19] Several analytical models for the conventional LDMOS devices have been reported to approximate the surface electric field.…”
Section: Introductionmentioning
confidence: 99%
“…One direction in the development of the power devices is to achieve a compromise between the breakdown voltage (BV) and specific on-resistance (R on,sp ), expressed as the figure of merit FOM1 (FOM1 = BV 2 / R on,sp ). The trench and vertical field plate (VFP) technologies have been widely used to design the power devices with high BV and low R on,sp [2][3][4][5][6][7][8]. The trench in the drift region can short the lateral length of the device [9].…”
Section: Introductionmentioning
confidence: 99%