2020
DOI: 10.1364/optica.392800
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Tunable SIM: observation at varying spatiotemporal resolutions across the FOV

Abstract: To date, imaging systems have generally been designed to provide an even spatiotemporal resolution across the field of view (FOV). However, this becomes a fundamental limitation when we aim to simultaneously observe varying dynamics at different parts of the FOV. In conventional imaging systems, to capture fast dynamics occurring at only a small portion of the FOV, the entire imaging system's sampling rate must be increased. This is a major problem if different parts of the FOV must rather be imaged at high sp… Show more

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Cited by 5 publications
(1 citation statement)
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“…These patterns can be generated either by a projection of a physical grid pattern, or with electronic devices, such as spatial light modulators, [132][133][134] or digital mirror devices. [135][136][137][138] Multiplication of the sample structure with the illumination pattern generates interference patterns in form of Moiré fringes that contain information about the fine details of the sample structure that could not be observed in diffraction-limited imaging. A series of images is acquired with different pattern positions and orientations, and computational techniques are then applied to remove the illumination structure and retrieve high-resolution information.…”
Section: Afm and Super-resolved Structured Illumination Microscopy (Smentioning
confidence: 99%
“…These patterns can be generated either by a projection of a physical grid pattern, or with electronic devices, such as spatial light modulators, [132][133][134] or digital mirror devices. [135][136][137][138] Multiplication of the sample structure with the illumination pattern generates interference patterns in form of Moiré fringes that contain information about the fine details of the sample structure that could not be observed in diffraction-limited imaging. A series of images is acquired with different pattern positions and orientations, and computational techniques are then applied to remove the illumination structure and retrieve high-resolution information.…”
Section: Afm and Super-resolved Structured Illumination Microscopy (Smentioning
confidence: 99%