Two-port network analyzer calibration using an unknown 'thru'

Ferrero, A.; Pisani, U.

doi:10.1109/75.173410

Cited by 254 publications

(87 citation statements)

References 8 publications

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“…By measurements of two single-port standards R 11 and R 21 at port 1 (Figure 2a), two Equations similar to (1) can be obtained, and after combination the result is shown as follows:…”

Section: Construction Of the T-matrices Of Error Boxesmentioning

confidence: 99%

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Zhao

Liu²,

Wang

et al. 2017

Applied Sciences

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This paper investigates a unified theory to derive vector network analyzer calibration algorithms based on the T-matrix representation, by which means the line-reflect-match (LRM), line-reflect-match-match (LRMM), and the line-reflect-reflect-match (LRRM) calibrations are formulated. The proposed calibration theory is more general than other versions of LRM, LRMM, and LRRM in that an arbitrary known two-port device can be used as the line standard L, rather than a perfect thru or transmission line. Experimental verifications of the proposed theory using on-wafer calibrations from 0.5 GHz to 110 GHz are given.

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“…By measurements of two single-port standards R 11 and R 21 at port 1 (Figure 2a), two Equations similar to (1) can be obtained, and after combination the result is shown as follows:…”

Section: Construction Of the T-matrices Of Error Boxesmentioning

confidence: 99%

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Zhao

Liu²,

Wang

et al. 2017

Applied Sciences

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show abstract

“…Owing to the lack of a well-defined thru standard in the proposed double-sided measurement method of SE TSV, our earlier works [15,19] SOLR calibration method allows for the use of an undefined reciprocal thru standard to perform the calibration [19,20]. However, calibration bandwidth is often limited by the crosstalk levels between the top and bottom probes since the SOLR procedure does not include the calibration of forward and reverse isolation, which is required in the SOLT method.…”

Section: Measurement Setup and Calibrationmentioning

confidence: 99%

“…However, measuring SE TSVs requires tremendous efforts in de-embedding, which is both time consuming and prone to inaccuracy. To measure 3D interconnects, this work develops a novel doublesided probing system [19], as shown in Figure 6(a), to facilitate the calibration and measurement procedures for a DUT with the test pads on opposite side of a substrate. The probe station of this system uses a sandwich-like holder with a hole in the center of its top and bottom plates, as shown in Figure 6(b), to grip the silicon interposer under testing.…”

Section: Measurement Setup and Calibrationmentioning

confidence: 99%

Comparative Modeling of Single-Ended Through-Silicon Vias in Gs and GSG Configurations Up to v-Band Frequencies

Lu¹,

Horng²

2013

PIER

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Abstract-This work presents a novel comparative modeling scheme for single-ended (SE) through-silicon vias (TSVs) in GSG and GS configurations. Physical scalable models based on the equations developed herein indicate that the use of two symmetric ground TSVs in GSG configuration relatively increases the parasitic capacitance and conductance in the silicon substrate. However, this increase in the parasitic capacitance requires that the parasitic inductance of SE TSV is reduced to maintain the same phase velocity in silicon. According to the modeling results, the GSG configuration has a larger insertion loss than that of the GS configuration because the former has a higher substrate conductance. Nevertheless, when measured using RF coaxial probes, the GSG configuration exhibits a larger measurement bandwidth than the GS configuration. Finally, with the assistance of a double-sided probing system, wideband S-parameter measurement can validate the established equivalent-circuit model of SE TSV in GSG configuration up to V-band frequencies.

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“…A simple rough knowledge of the unknown phase shift ( π) allows us to solve the e sign ambiguity [6]. The characteristic variable m is obtained.…”

Section: Theorymentioning

confidence: 99%

A Calibration Procedure for Two-Port Vna With Three Measurement Channels Based on T-Matrix

Zhao¹,

H²,

Long³

2012

PIER Letters

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Abstract-A simplified calibration procedure using T -matrix concept is presented for two-port vector network analyzer (VNA) with three measurement channels. Compared with Short-Open-Load-Thru (SOLT) calibration method based on 10-term error model where 10 error terms must be solved and saved at each frequency, the proposed method need define fewer characteristic variables. Moreover, a lengthunknown 50 Ω line can be used instead of a random single-port standard, for example, substituting Load standard with 50 Ω line in SOLT calibration procedure. Via the simplified calibration procedure, the scattering parameters of a two-port device under test (DUT) can be finally obtained. Experimental verification is carried out, and good agreement is observed.

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Two-port network analyzer calibration using an unknown 'thru'

Cited by 254 publications

References 8 publications

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

A Unified Approach for Reformulations of LRM/LRMM/LRRM Calibration Algorithms Based on the T-Matrix Representation

Comparative Modeling of Single-Ended Through-Silicon Vias in Gs and GSG Configurations Up to v-Band Frequencies

A Calibration Procedure for Two-Port Vna With Three Measurement Channels Based on T-Matrix

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