2017
DOI: 10.1117/12.2251145
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Ultimate high power operation of 9xx-nm single emitter broad stripe laser diodes

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Cited by 9 publications
(5 citation statements)
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“…Here, it is assumed that the amplifier chip is made on the basis of an integrated heterostructure, with optimal param eters (thickness and composition of layers) for obtaining high power in the fundamental mode of operation. It will be the heterostructure for a highbrightness diode laser (see, for example, [37][38][39][40]). The basic difference between a diode amplifier and a diode laser lies in the absence of a cavity in the first one.…”
Section: Three-section Amplifier With Different Values Of the Amplitu...mentioning
confidence: 99%
“…Here, it is assumed that the amplifier chip is made on the basis of an integrated heterostructure, with optimal param eters (thickness and composition of layers) for obtaining high power in the fundamental mode of operation. It will be the heterostructure for a highbrightness diode laser (see, for example, [37][38][39][40]). The basic difference between a diode amplifier and a diode laser lies in the absence of a cavity in the first one.…”
Section: Three-section Amplifier With Different Values Of the Amplitu...mentioning
confidence: 99%
“…Several companies had already produced commercially available 780–1064 nm high-power LDs with various geometric arrangements such as single emitters and bars (Chen et al , 2014; Morales et al , 2016). While GaAs-based LDs tend to have high emission power and high efficiencies, the series resistance associated with the ohmic contact still limits their performance to a certain extent (Tahamtan et al , 2011; Zediker et al , 2017; Ladugin et al , 2017). In addition, the series resistance not only affects the operating voltages of the LD devices but also their optical output power, conversion efficiency and thermal stability (Tahamtan et al , 2011).…”
Section: Introductionmentioning
confidence: 99%
“…The inhomogeneously distributed carriers are important at room temperature at very high injection current densities (pulsed operating regime) whereas the carriers generated by the thermal escape are likely to dominate at more modest currents and elevated temperatures, which is often the case in the continuous wave (CW) regime. The accumulation of spatially inhomogeneous carriers is strongly reduced by using a waveguide structure in which the active layer is positioned asymmetrically, near the p-emitter [1][2][3][4][5][6]. In this case, the p-side of the OCL (the part between the active layer and the p-emitter, see inset to figure 1), in which the inhomogeneous carriers accumulate more easily [7], is narrow, in extreme cases almost non-existent.…”
Section: Introductionmentioning
confidence: 99%