Transient reflectivity measurements of thin films, ranging from 6 to 40 nm in thickness, of the topological insulator Bi 2 Se 3 revealed a strong dependence of the carrier relaxation time on the film thickness. For thicker films the relaxation dynamics are similar to those of bulk Bi 2 Se 3 , where the contribution of the bulk insulating phase dominates over that of the surface metallic phase. The carrier relaxation time shortens with decreasing film thickness, reaching values comparable to those of noble metals. This effect may result from the hybridization of Dirac cone states at the opposite surfaces for the thinnest films.Topological insulators (TIs) are novel electronic materials that have an insulator-type band gap in the bulk (for Bi 2 Se 3 E g ~ 0.3 eV) but have protected gapless conducting phase on their surface due to the combination of spin-orbit interactions and time-reversal symmetry. 1,2 The most effective experimental methods currently used to monitor metallic two-dimensional (2D) Dirac surface states (SS) of TIs are angle-resolved photoemission spectroscopy (ARPES) and time-resolved ARPES (TrARPES). 1-7 These techniques are equally sensitive to SS and the bulk atoms residing in the close proximity to the surface as a consequence of the extremely small penetration depth (a few nm) of incident energetic photons used for photoemission, combined with the limited escape depth of the electrons (also a few nm). Finite-size effects have also been studied for thin Bi 2 Se 3 films of only a few nm thick and a crossover of the three-dimensional (3D) TI Bi 2 Se 3 to the 2D limit (gapped SS) has been observed when the thickness is below six quintuple layers (~ 6 nm). 8 Reaching a similar sensitivity to SS using traditional optical pump-probe techniques (like transient reflectivity (TR)/transmission), which use less energetic photons in the visible/infrared range, seems problematic since the absorption length of the laser light normally used for these measurements (a few tens of nm) significantly exceeds the range where the effect of SS can actually be monitored. As a result, for bulk single crystals of Bi 2 Se 3 the transient optical response is dominated by the bulk contribution. To overcome the problem one can use SS/surface sensitive methods. An example of this approach has recently been demonstrated by illuminating Bi 2 Se 3 with circularly polarized near-infrared light. 9 The resulting photocurrent which reverses its direction with a reversal of the helicity of the light unambiguously proves the SS origin of the optical response. Another surface sensitive technique exploits the centrosymmetric nature of TI's, which governs exclusively the surface-related response which results in an optical second harmonic generation (SHG) process. 10,11 In this Letter we report on a new way to distinguish between the contributions from the TI (Bi 2 Se 3 ) bulk 3D states and the 2D gapless SS, which is based on differences in the carrier relaxation rates for the insulating and metallic phases. We demonstrate that the car...