Ultrasonically Induced Magnetic Reversals Observed by Stroboscopic Electron Microscopy

Bostanjoglo, O.; Rosin, T.

doi:10.1080/713819603

Cited by 20 publications

(8 citation statements)

References 8 publications

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“…The methods generally fall into two approaches, stroboscopic and single shot. The stroboscopic method [5][6][7][8][9][10][11] has been advanced recently in the lab of Prof. A. Zewail at CalTech [12]. In the recent stroboscopic approach [13,14], the specimen is repetitively pumped into a cyclic state by one branch of a femtosecond laser pulsed at a high frequency (MHz or faster) while another branch is used to create a pulse train of electrons that probes the specimen at some particular point in its pump cycle.…”

Section: Introductionmentioning

confidence: 99%

Quantifying transient states in materials with the dynamic transmission electron microscope

Campbell

LaGrange

Kim

et al. 2010

Journal of Electron Microscopy

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(250 words)The Dynamic Transmission Electron Microscope (DTEM) offers a means of capturing rapid evolution in a specimen through in-situ microscopy experiments by allowing 15 ns electron micrograph exposure times. The rapid exposure time is enabled by creating a burst of electrons at the emitter by ultraviolet pulsed laser illumination. This burst arrives a specified time after a second laser initiates the specimen reaction. The timing of the two Q-switched lasers is controlled by highspeed pulse generators with a timing error much less than the pulse duration. Both diffraction and imaging experiments can be performed, just as in a conventional TEM. The brightness of the emitter and the total current control the spatial and temporal resolutions. We have demonstrated 7 nm spatial resolution in single 15 ns pulsed images. These single-pulse imaging experiments have been used to study martensitic transformations, nucleation and crystallization of an amorphous metal, and rapid chemical reactions. Measurements have been performed on these systems that are possible by no other experimental approaches currently available.2

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Section: Introductionmentioning

confidence: 99%

Quantifying transient states in materials with the dynamic transmission electron microscope

Campbell

LaGrange

Kim

et al. 2010

Journal of Electron Microscopy

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“…Here, recent advances in using pulsed beams comrpised of picosecond-to femtosecond-duration electron packets specifically for mitigating damage will be discussed. Though approaches to producing pulsed beams in the TEM have also been explored for decades (see, for example, [4]), more recent advances based upon femtosecond pulsed lasers and high-frequency, RF-modulated chopped beams have introduced high levels of control over elapsed time and electron-packet number density [5][6][7]. As a result, reports are now beginning to emerge that indeed provide evidence of specimen damage mitigation using temporally-shaped and precisely-modulated pulsed electron beams in the TEM.…”

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confidence: 99%

Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage

Flannigan

VandenBussche

2020

Microsc Microanal

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“…Stroboscopic time-resolved TEM capable of reaching temporal resolutions that go beyond detector limits has been in use for decades (see, for example, [1]). With few exceptions, this early work, and the more recent work focused on studying materials processes that form new structures or states without returning to the initial conditions on typical experimental timescales [2], probed mainly nanosecond dynamics.…”

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confidence: 99%