In
this paper, we report the fabrication and characterization of
high-quality distributed Bragg reflectors (DBRs) deposited by low-energetic
thermal evaporation. This technique allows deposition of high-quality
thin films with an accurate control of thickness at the nanoscale.
We investigated, for the first time, the use of tungsten oxide (WO3) and calcium fluoride (CaF2) as high (2.15) and
low (1.4) refractive index materials, respectively, for DBR fabrication.
They consist of nine pairs of WO3/CaF2 layers,
with a central wavelength λc tuned at 640 nm and
a maximum reflectance of 99.6%. A passive microcavity consisting of
a λ/2 thick spacer of CaF2 sandwiched between 8.5
pairs of WO3/CaF2 has also been fabricated.
We investigated the optical behavior of this microresonator after
post-deposition thermal treatment at different temperatures, showing
a blue shift of the resonant mode and an increase in its intensity.
Indeed, heat treatment induced a compaction of the DBR multilayer,
leading to more defined and clearer interfaces, as demonstrated by
scanning electron microscopy cross section measurements. This behavior
results in an improvement of the microcavity quality factor (up to
400) as the temperature increases, which is currently the highest
value obtained for microcavities obtained by thermal evaporation processes,
so far. These results represent a further step forward toward the
development of high-reflectivity mirrors and high-quality microresonators
fabricated by the low-energy deposition technique. Such a structure
could find extensive application in nano-photonics, optoelectronics,
and sensors, even based on soft organic materials.