“…There, one could argue that solid-state effects should not be taken into account, as charge-transfer processes intrinsically take place at the molecular level. Thus, it was suggested that energy levels taken from cyclic voltammetry (CV) or energy resolved-electrochemical impedance spectroscopy (ER-EIS) are most appropriate for discussing CPX or IPA formation. ,, In contrast, the energy-level alignment in heterostructures takes place on a nonlocal, macroscopic scale, and the relevant IEs and EAs are routinely taken from ultraviolet photoelectron spectroscopy (UPS) and inverse photoemission (IPES), respectively. , Notably, these thin-film IE and EA values are not material parameters but depend strongly on the film thickness and the intermolecular organization in the thin films. , As an example, for P3HT, reported thin-film IEs range from around 4 to 5 eV, ,, and for the EA of F4TCNQ, values of 5.24 and 5.08 eV have been reported. Also, it has been put forward that the EA of dopants embedded in a host matrix differs from that in a pristine dopant film. , Furthermore, an intrinsic energetic disorder of organic thin films broadens the density of states (DOS) of molecular energy levels leading to typical standard deviations (σ) of the Gaussian HOMO DOS of 250 meV in UPS measurements. ,, For the determination of IE and EA, the onsets of the HOMO- and LUMO-derived peaks are usually used as they contribute to charge transport and exchange processes (commonly referred to as “mobility edge”) .…”