2008 1st Microsystems and Nanoelectronics Research Conference 2008
DOI: 10.1109/mnrc.2008.4683396
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Use of structural tests in RTL verification

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Cited by 6 publications
(5 citation statements)
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“…In [11], we showed based on experimental results that dark corners are a subset of hard faults and, that the use of structural test patterns in the RT level verification could help improve the nodes' controllability/observability and cover the dark corners.…”
Section: Proposed Methodologymentioning
confidence: 99%
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“…In [11], we showed based on experimental results that dark corners are a subset of hard faults and, that the use of structural test patterns in the RT level verification could help improve the nodes' controllability/observability and cover the dark corners.…”
Section: Proposed Methodologymentioning
confidence: 99%
“…This model is based on the stuck at model but takes transition propagation into account. In [11] we justified our choice for the transition fault model (launch on capture) as the model to generate the test patterns.…”
Section: Proposed Methodologymentioning
confidence: 99%
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“…Hobeika et al establish in [5] the relationship between existing dark corners in functional verification and hard to detect stuck-at faults. Based on this relation, they explore the use of structural test patterns in the verification process and compare the results to well-known verification techniques.…”
Section: A Related Work On Functional Simulation Based Rtl Atpgmentioning
confidence: 99%
“…[7] uses RTL stuck-at fault injection and [10] uses error injection, whereas the proposed flow in this paper works without an injection based technique. [5] concentrates on dark corners of the design, this paper targets 100% GIF-PO coverage of the complete design.…”
Section: Difference To Related Workmentioning
confidence: 99%