“…Additionally, the refined atomic parameters should agree well with the structure derived from single-crystal X-ray diffraction data.͔ Since then, preferred orientation has been a part of Rietveld refinement because the method is well suited to low-symmetry compounds with many closely spaced and partially overlapped peaks, whereas it is still difficult to measure quantitative pole figures for complex X-ray powder diffraction ͑XRD͒ and ND data for such materials. The March model ͑Dollase, 1986;O'Connor et al, 1991O'Connor et al, , 1992Sitepu, , 1998Li, 2004, 2005͒, the generalized spherical-harmonic ͑GSH͒ description ͑Ahtee et al., 1989;Popa, 1992;Järvinen, 1993;Von Dreele, 1997;Bergmann et al, 2001;Sitepu et al, 2001;Sitepu, Schmahl, and Allafi et al, 2002;Sitepu, Schmahl, and Stalick, 2002;Sitepu, Schmahl, and Von Dreele, 2002;Sitepu, 2003Sitepu, , 2007Sitepu, , 2008Sitepu, O'Connor, Benmarouane et al, 2004͒, and the Williams-Imhof-Matthies-Vinel method ͑Matthies et al., 1988Lutterotti et al, 2004͒ have been successfully used to describe the texture resulting from packing effects in Bragg-Brentano and Debye-Scherrer powder diffraction measurements using Rietveld refinement programs. The descriptions of the BGMN, DBWS, FULLPROF, GSAS, LHPM, MAUD, and NXD programs and links to them can be obtained via the Collaborative Computational Project, No.…”