1989
DOI: 10.1016/0168-9002(89)90088-0
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Use of synchrotron radiation for calibration of a working measuring instrument based on plasma focus

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Cited by 6 publications
(7 citation statements)
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“…In the present study, the attenuation coefficient was estimated by the extrapolation of data calculated with the NIST Attenuation database [43]. A rough estimation of I λ is possible with data on the MPC radiance B λ [22,25,26] as:…”
Section: Discussionmentioning
confidence: 99%
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“…In the present study, the attenuation coefficient was estimated by the extrapolation of data calculated with the NIST Attenuation database [43]. A rough estimation of I λ is possible with data on the MPC radiance B λ [22,25,26] as:…”
Section: Discussionmentioning
confidence: 99%
“…A photo of the sample placement (for Mo/Si samples) in the chamber is presented in Figure 1. Generation of compressed plasma flows and the radiation fluxes were carried out with a high-current plasma accelerator (MPC) with a coaxial electrode unit 1 [22,25,26]. The electrodes were made from AISI 321 steel.…”
Section: Methodsmentioning
confidence: 99%
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“…These measures allow us to ensure a stability and reproducibility of secondary-standard lamps that is no greater than 4 % per year. For wavelengths shorter than 105 nm, suitable secondary standards are windowless sources such as those based on a discharge with evaporating walls or based on plasma focus [9]. Both sources emit pulsed radiation with a pulse-width of some microseconds in the spectral range 30 nm to 200 nm (powerful continuous radiation spectral radiance of order 10 15 W/m 3 sr to 10 17 W/m 3 sr).…”
Section: Secondary-standard Vuv and Uv Radiation Sourcesmentioning
confidence: 99%
“…The high current emitters based on compressed plasma jets are sources of powerful broadband radiation (with fluxes of ≈10 20 -10 22 photon/s per a single pulse) [1]. Ponderomotive forces lead to formation of a high temperature plasma focus with a brightness temperature of ≈30-100 kK [2]. The maximal spectral brightness lies within the range of ≈30-100 nm.…”
Section: Introductionmentioning
confidence: 99%