1974
DOI: 10.1088/0022-3735/7/8/001
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Use of X-ray fluorescence for chemical analysis

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Cited by 12 publications
(7 citation statements)
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“…Other recent reviews have been presented by Jenkins (147), Parsons (231), Urch (313), MacDonald (195), and Owers and Shalgosky (229). Wilson (335), Scharschmidt (261), and have presented brief surveys in the collected monograph edited by Korte.…”
Section: Techniquesmentioning
confidence: 99%
“…Other recent reviews have been presented by Jenkins (147), Parsons (231), Urch (313), MacDonald (195), and Owers and Shalgosky (229). Wilson (335), Scharschmidt (261), and have presented brief surveys in the collected monograph edited by Korte.…”
Section: Techniquesmentioning
confidence: 99%
“…The combination of a reasonable resolution of a few microns combined with a detection power in the ppm (10 À6 g g À1 ) range offers possibilities for trace element mapping giving insight in trace element composition. PIXE method has been widely used for trace elemental analysis since Johansson et al (1970) achieved mass detection limits in the region of 10 À12 g. The extensive literature on the subject includes several excellent review articles (Johansson and Johansson, 1976;Owers and Shalgosky, 1974).…”
Section: Introductionmentioning
confidence: 99%
“…PIXE method has been widely used for trace elemental analysis since Johansson et al (1970) achieved mass detection limits in the region of 10 -12 g. The extensive literature on the subject includes several excellent review articles (Johansson S.A.E. and Johansson T.B.,1976 ;Owers and Shalgosky, 1974).…”
Section: Introductionmentioning
confidence: 99%
“…A tecnica de fluorescencia de raios X pode ser aplicada em aniilises arnbientais, aniilises de solus:oes e iiguas, aniilises de metais, aniilises de solos, rochas, entre viirias outras [33]. Antes de serem realizadas as aniilises, suspensoes e dispersoes devem ser estabilizadas para evitar sedimentas:iio.…”
Section: 5-fluorescencia De Raios X Dispersiva Em Energiaunclassified
“…A sensibilidade desse sistema permite a determina<;ao de elementos pesados a nivel de ppb em urna matriz !eve e a precisao e boa o bastante para permitir a determinas:ao da maior parte dos constituintes da amostra [51]. Alem disso, a ED-XRF toma possivel: a detecs:ao simultanea de todos OS elementos, a sobreposiyaO de Jinhas e cJaramente determinada, a geometria e compacta, tern alta eficiencia de detec<;ao, e a elimina<;ao do problema de movimento ou alinhamento das partes do espectrometro (como ocorre com o espectrometro com dispersao por comprimento de onda) [33].…”
Section: 5-fluorescencia De Raios X Dispersiva Em Energiaunclassified