2012 IEEE International Symposium on Electromagnetic Compatibility 2012
DOI: 10.1109/isemc.2012.6351752
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Using GTEM cells for immunity tests on electronic boards with microcontroller

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Cited by 7 publications
(12 citation statements)
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“…GTEM cells can be used to perform tests over a certain EUT in order to evaluate its immunity to an incidental electromagnetic field [36]. The analysis of the QP values reveals that none of them exceeds the maximum allowed limit of 40 dB(µV/m) for the range (30-230) MHz and 47 dB(µV/m) for the range (230-1000) MHz [29].…”
Section: Testing the Immunity Of A Laptopmentioning
confidence: 99%
See 1 more Smart Citation
“…GTEM cells can be used to perform tests over a certain EUT in order to evaluate its immunity to an incidental electromagnetic field [36]. The analysis of the QP values reveals that none of them exceeds the maximum allowed limit of 40 dB(µV/m) for the range (30-230) MHz and 47 dB(µV/m) for the range (230-1000) MHz [29].…”
Section: Testing the Immunity Of A Laptopmentioning
confidence: 99%
“…GTEM cells can be used to perform tests over a certain EUT in order to evaluate its immunity to an incidental electromagnetic field [36].…”
Section: Testing the Immunity Of A Laptopmentioning
confidence: 99%
“…A complementary immunity experiment is performed with Transverse Electrical-Magnetic mode cell (Crawford TEM cell) configurations, including the thermal experiment solutions. TEM cell is commonly used for EMC characterization, from 1MHz up to 3GHz, at PCB and Integrated Circuits levels [8] [9]. As a well-suited alternative to large size experimental equipment for conventional radiated far field characterization, it allows very pertinent solutions for selective electromagnetic characterization of single electronic devices enclosed in the shielded cell environment.…”
Section: B Tem Cell Aggression Test Benchmentioning
confidence: 99%
“…We actually investigate these effects mainly for one of the most thermal sensitive chips used in power electronic modules, including driver technology [4] [5]. Actual state-of-the art of radiated EMC characterizations, both emission and immunity, can be performed over Printed Circuit Board(PCB) and Integrated Circuits(IC) with Near-Field probe's sets guided by a motorized scan table and/or Transverse Electro-Magnetic(TEM) cells [6] [7] [8]. In these two cases, often dedicated PCB's are especially designed, inherently for TEM cell, to comply with Standardized Cell Aperture (10cm*10cm), and also to separate inside/outer electromagnetic sources and victims [9].…”
Section: Introductionmentioning
confidence: 99%
“…The systems in [7] and [11] provide a more detailed design approach, but do not highlight simulation or practical manufacturing difficulties in building GTEM cells in-house. The current body of literature's upper limit of consideration on field strength in GTEM cells is 200 V/m [12] at frequencies well below 1 GHz.…”
Section: Introductionmentioning
confidence: 99%