UWB-radar based surface permittivity estimation in hostile and pathless security scenarios

Friederich, B.; Schultze, Thorsten; Willms, Ingolf

doi:10.1109/icuwb.2014.6958963

Cited by 7 publications

(3 citation statements)

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“…It utilizes the material dependent differences in the reflection coefficients for a known angle of incidence. An ellipsometric setup can be realized for a linear polarized emitter and detector if s-and p-components are equal in amplitude [18], [19]. In Fig.…”

Section: Terahertz Ellipsometrymentioning

confidence: 99%

Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

et al. 2020

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Material characterization in the 0.1-10 THz range has been a major topic of research since its first demonstration 30 years ago. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power and signal-to-noise ratio. However, material characterization is still performed using conventional spectroscopic measurement schemes which require detailed information about the test object's shape, location, orientation relative to the measurement system, and a reference measurement. Here, we present a method for reference-free material characterization of dielectric objects using a terahertz time-domain spectroscopy system without a priori knowledge about the object and its position. The proposed method is based on ellipsometry combined with lensless imaging for the estimation of the refractive index. The method is a multistage procedure designed for small test objects in reflection mode. The diffracted terahertz radiation is separated from the specular reflected radiation in a post-processing step to enable a valid material parameter estimation. In this way, small dielectric objects can be located, imaged with a sub-mm resolution, and their material parameters extracted. INDEX TERMS material characterization, refractive index, THz imaging

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Section: Terahertz Ellipsometrymentioning

confidence: 99%

Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

et al. 2020

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“…However, a relative error within a group of target points are not so much deviated, and any image offers a part of the original ellipsoid shape, which could not be obtained by DAS‐based image. Note that if we know the dielectric constant of the wall, the above problem would be eliminated using other permittivity estimation methods such as ellipsometry [23] or inverse scattering analysis, and we will incorporate imaging and permittivity estimation in our future endeavour. Furthermore, this simulation model assumes homogeneity of the wall; it is easy to predict that the imaging accuracy of the RPM or other DAS‐based methods degrade for the heterogeneous walls.…”

Section: Evaluation In Numerical Simulationmentioning

confidence: 99%

RPM and Doppler‐based multi‐path exploitation method for UWB TWR

Setsu

Kidera

2019

IET Radar, Sonar & Navigation

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“…For smaller objects and even rough surfaces more information of the surface is needed ( [3] and [4]). Hence, a surface adaptive permittivity estimation is required.…”

Section: A Microwave Retroreflector Ellipsomety (Mre)mentioning

confidence: 99%

Polarimetric imaging method for a surface adaptive permittivity estimation for 60 GHz FMCW Radar

Friederich

Damyanov

Schultze

et al. 2016

2016 10th European Conference on Antennas and Propagation (EuCAP)

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The chaining of imaging techniques with material characterization capabilities is a very promising approach in the field of security applications. In this paper a polarimetric measurement setup which combines the advantages for imaging and material characterization is introduced. In the herein developed novel set-up the disadvantage of a bistatic configuration is overcome by the implementation of a retroreflector, allowing measurements applying a low-cost, single chip radar. This method is the basis for the combination of material characterization and imaging of targets with rough surface. Furthermore, a modified real time capable convergence algorithm based on [9] is proposed for the purpose of accurate imaging of rough objects. For the validation of this technique polarimetric measurements of real and rough objects are performed and the benefit of the polarimetric evaluation is shown.

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UWB-radar based surface permittivity estimation in hostile and pathless security scenarios

Cited by 7 publications

References 1 publication

Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

Reference-Free Material Characterisation of Objects Based on Terahertz Ellipsometry

RPM and Doppler‐based multi‐path exploitation method for UWB TWR

Polarimetric imaging method for a surface adaptive permittivity estimation for 60 GHz FMCW Radar

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