2008
DOI: 10.1063/1.2977478
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Valence band offset of ZnO/Zn0.85Mg0.15O heterojunction measured by x-ray photoelectron spectroscopy

Abstract: X-ray photoelectron spectroscopy was used to measure the valence band offset at the ZnO/Zn0.85Mg0.15O heterojunction grown by plasma-assisted molecular beam epitaxy. The valence band offset (ΔEV) is determined to be 0.13 eV. According to the experimental band gap of 3.68 eV for the Zn0.85Mg0.15O, the conduction band offset (ΔEC) in this system was calculated to be 0.18 eV. The ΔEc:ΔEv in ZnO/Zn0.85Mg0.15O heterojunction was estimated to be 3:2.

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Cited by 61 publications
(45 citation statements)
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“…25 This band gap difference is distributed to 70% to the conduction band and 30% to the valence band (as for AlGaN/GaN a type-I alignment). 26 So even for the highest composition, an offset in the conduction band between Mg x Zn 1Àx O and Cu 2 O of 0.2 eV remains. …”
mentioning
confidence: 99%
“…25 This band gap difference is distributed to 70% to the conduction band and 30% to the valence band (as for AlGaN/GaN a type-I alignment). 26 So even for the highest composition, an offset in the conduction band between Mg x Zn 1Àx O and Cu 2 O of 0.2 eV remains. …”
mentioning
confidence: 99%
“…Another important and debated quantity is the conduction band offset at heterointerfaces DE C =DE g : Earlier works suggested a ratio of about 0.9 57,58 for ZnO/MgZnO, but the present consensus is for a smaller value in the range of 0.6 to 0.7. [59][60][61] In the absence of reliable experimental determinations for ZnO/BeZnO interfaces, a band offset DE C =DE g ¼ 0:65 has been used in the present work for both MgZnO and BeZnO heterojunctions.…”
Section: Models For the Materials Propertiesmentioning
confidence: 99%
“…According to the X-ray photoelectron spectroscopy (XPS) data of valence band offset of ZnO/Zn 0.85 Mg 0.15 O, the E g of Zn 0.85 Mg 0.15 O and ZnO is 3.68ev and 3.37ev and ∆Ec is 0.18ev. 5 The 2DEG created by ZnMgO ADB exist in the space charge region of ZnO p-n junctions on the interface between p-type and n-type layer based on the Hall-effect data.…”
Section: Methodsmentioning
confidence: 99%
“…Based on the realization of p-type ZnO thin film, the ZnO p-n homojunctions can be prepared. 1 Recent technological advancement in ZnO heterostructures has expanded the possibility of device functionalities to various kinds of applications like light-emission diodes, 2-4 laser diodes, 5 photo detectors, [6][7][8] and transistor. 9 Multiple quantum barriers (MQB) structure can be used to adjust the optical and electrical properties of ZnO films and heterostructures.…”
Section: Introductionmentioning
confidence: 99%