2007
DOI: 10.1016/j.jcrysgro.2006.10.004
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Vapor phase diffusion and surface diffusion combined model for InGaAsP selective area metal–organic vapor phase epitaxy

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Cited by 15 publications
(12 citation statements)
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“…One factor would be the difference in the diffusion lengths in the vapor-phase diffusion of Ga and In precursors. According to the analysis of the in-plane growth rate profile in the SAG of InN and GaN [6], the vapor-phase diffusion length is smaller than 20 mm for GaN and approximately 100 mm for InN at the growth condition of this experiment. Therefore, according to the vapor-phase diffusion, the center of the 60-mmwide stripe becomes In-rich because a Ga precursor diffusing from above the mask will be incorporated into the InGaN layer within roughly 20 mm from the mask edge, while a precursor of In can diffuse into the center of the growth area.…”
Section: Origin Of the Shift In The Luminescence Peak Wavelength Frommentioning
confidence: 78%
“…One factor would be the difference in the diffusion lengths in the vapor-phase diffusion of Ga and In precursors. According to the analysis of the in-plane growth rate profile in the SAG of InN and GaN [6], the vapor-phase diffusion length is smaller than 20 mm for GaN and approximately 100 mm for InN at the growth condition of this experiment. Therefore, according to the vapor-phase diffusion, the center of the 60-mmwide stripe becomes In-rich because a Ga precursor diffusing from above the mask will be incorporated into the InGaN layer within roughly 20 mm from the mask edge, while a precursor of In can diffuse into the center of the growth area.…”
Section: Origin Of the Shift In The Luminescence Peak Wavelength Frommentioning
confidence: 78%
“…The diffusion length is close to the size of (1-101) GaN stripe; therefore, such an extreme ridge growth occurred. The different distribution in the two kinds of (1-101) facet is more stable to form than (11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) facet in the case of GaN growth [14]. By increasing the growth pressure from 200 to 600 Torr, we succeeded in obtaining more uniform layers, as shown in Figs. 3(a) and 3(b).…”
Section: Contributed Articlementioning
confidence: 85%
“…First, we employed (11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) and (1-101) GaN microstripes on (113) Si and (001) Si substrates as templates. The typical structures are shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
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