“…This method overcomes problems associated with friction, adhesion, electrostatic forces, and other difficulties that conventional AFM scanning methods by alternately placing the tip in contact with the surface to provide high resolution and then lifting the tip off the surface to avoid dragging the tip across the surface, avoiding sample damage by compressing, and tearing. The cantilever vibrates at its resonant frequency under an external electrical excitation, the feedback loop adjusts the oscillation amplitude to restore the original set point value, and a height image can be recorded (Putman, van der Werf et al 1994;Schindler, Badt et al 2000). The contrast of a phase image is directly dependent on the elastic properties of the sample.…”