VNA S11 Uncertainty Measurement a Comparison of Three Techniques

Oldfield, Bill

doi:10.1109/arftg.1992.326976

Cited by 11 publications

(5 citation statements)

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“…The noise floor along with the calibration procedure determine the test port characteristics of directivity, source match, and load match. These measurement system characteristics are uncertainties which can be propagated to determine the overall S11 magnitude and phase uncertainty for a given measurement frequency and S11 magnitude [2][3][4][5].…”

Section: A S11 Uncertaintymentioning

confidence: 99%

“…For this purpose, a multipath Rician fading channel model, which is designed for line-of-sight communication purposes, is used rather than an additive white or colored noise model. The reason for this is that white noise is more representative of the receiver noise, which is already accounted for in the S11 uncertainty analysis of the previous section, than background reflections [3]. When it comes to colored noise, Brownian noise has been previously used in chipless RFID Monte Carlo simulations to mimic the effects of tag movement [6].…”

Section: B Clutter Uncertaintymentioning

confidence: 99%

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Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties

Brinker

Zoughi

2022

IEEE Open J. Instrum. Meas.

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Measurement and response decoding is an ongoing challenge in the chipless radio frequency identification (RFID) field. Measurement uncertainties, including tag/reader misalignment, S-parameter error, and clutter, can cause response distortions, such as magnitude changes and resonant frequency shifts, that can lead to the improper assignment of a binary code or sensing parameter (i.e., decoding). This work aims to use local sensitivity analysis and Monte Carlo simulation to fully characterize the effects of misalignment, response parameter measurement error (e.g., VNA S-parameter error), and clutter on chipless RFID responses that are measured in the near-field with a monostatic setup. From this type of comprehensive characterization, conclusions are drawn about the identification (ID) and sensing capabilities of the tags. While the effect of misalignment-based uncertainty was examined in Part I, here in Part II S11 uncertainty and clutter-based uncertainty are examined both individually and in combination with misalignment-based uncertainty. An example, demonstrating the application of the proposed tag performance assessment framework is also provided.

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Section: A S11 Uncertaintymentioning

confidence: 99%

Section: B Clutter Uncertaintymentioning

confidence: 99%

Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties

Brinker

Zoughi

2022

IEEE Open J. Instrum. Meas.

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“…Several methods of verification are known. In [3] the author performed a comparison of several methods. These methods use precision transmission lines and may be applied in the absence of a reference calibration kit.…”

Section: Introductionmentioning

confidence: 99%

“…The basic idea of verification is testing of standards (other than calibration standards) with known (or designed) frequency properties [1]- [3]. Several methods of verification are known.…”

Section: Introductionmentioning

confidence: 99%

Residual errors determination for vector network analyzer at a low resolution in the time domain

Savin

Guba²,

Maxson³

2013

82nd ARFTG Microwave Measurement Conference

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A method is introduced for determination of a vector network analyzer's calibration residual errors for measurement of the reflection coefficient. The method utilizes unscented Kalman filtering and spline interpolation time domain techniques. All three residual errors are calculated by processing the measured reflection coefficient of a single verification device, such as an air line terminated with a short or open network. The proposed method shows particular advantages when the use of a long verification line is impractical (e.g. at the wafer-level), or for measurements at low frequency ranges or similar cases when the resolution of conventional time domain methods is low.Experimental studies were conducted for two frequency ranges and in coaxial and on-wafer measurement environment. The proposed algorithm is a good candidate for a wide range of practical applications especially for measurement uncertainty estimation of cost-effective vector network analyzers.Index Terms -Vector network analyzer (VNA), verification, residual error box, unscented Kalman filters (UKF).

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“…There are two types of workhorse instruments which enable relatively precise and traceable measurements; impedance analysers (IAs) for RF measurements and vector network analysers (VNAs) for microwave measurements. Although VNAs offer broadband measurements up to at least 110 GHz, their accuracy is limited and depending on the frequency range of operation, it can vary from 1-10% [40]. In contrast, the IAs are limited in frequency range, typically 40 Hz to 110 MHz, but can be precise and accurate (to around 0.1-1% depending on the frequency range) if they are first calibrated using impedance standards of known frequency respons [41][42][43][44].…”

Section: Introductionmentioning

confidence: 99%

Radio‐frequency transport Electromagnetic Properties of chemical vapour deposition graphene from direct current to 110 MHz

Awan

Pan²,

Taan³

et al. 2015

IET Circuits, Devices & Systems

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We report measurement of the radio-frequency (RF) transport electromagnetic properties of chemical vapour deposition (CVD) graphene over the DC to 110 MHz frequency range at room temperature. Graphene on Si/SiO 2 substrate was mounted in a shielded four terminalpair (4TP) adaptor which enabled direct connection to a calibrated precision impedance analyser for measurements. Good agreement is observed for the DC four-probe resistance and the 4TP resistance at 40 Hz, both yielding R ≈ 104 Ω. In general the apparent graphene channel electromagnetic properties are found to be strongly influenced by the substrate parasitic capacitance and resistance, particularly for high-frequencies f > 1 MHz. A phenomenological lumped-parameter equivalent circuit model is presented which matches the frequency response of the graphene 4TP impedance device over approximately seven decades of the frequency range of the applied transport alternating current. Based on this model, it is shown for the first time, that the intrinsic graphene channel resistance of the 4TP device is frequency-independent (i.e. dissipationless) with R G ≈ 105 Ω or sheet resistance of approximately 182 Ω / □. The parasitic substrate impedance of the device is found shunt R G with R P ≈ 2.2 Ω in series with C P ≈ 600 pF. These results suggest that our new RF 4TP method is in good agreement with the conventional DC four-probe method for measuring the intrinsic sheet resistance of single-atom thick materials and could potentially open up new applications in RF electronics, AC quantum Hall effect metrology and sensors based on graphene 4TP devices operating over broad range of frequencies.

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VNA S11 Uncertainty Measurement a Comparison of Three Techniques

Cited by 11 publications

References 0 publications

Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties

Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part II: Consideration of Multiple Measurement Uncertainties

Residual errors determination for vector network analyzer at a low resolution in the time domain

Radio‐frequency transport Electromagnetic Properties of chemical vapour deposition graphene from direct current to 110 MHz

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