process are highly required and under investigation. [7,8] Recently, integrated circuits based on chemical vapor deposition (CVD)-grown wafer-scale MoS 2 , a representative of TMDs, have already been realized, [9,10] which is an important step toward the practical application of lowpower and high-performance 2D electronic devices. However, the fabrication of largescale MoS 2-based circuits still remains a challenge. One of the major limits is the lack of the homogeneous high-k dielectric deposition on the TMDs without dangling bonds. [11-13] Various technical efforts have been proposed to deposit high quality Al 2 O 3 or HfO 2 dielectrics, such as seeding layer, [14] remote plasma treatment, [15] and ultraviolet-ozone exposure. [16] However, due to the existence of interfacial charge traps or dipoles during atomic layer deposition (ALD) process, a significant n-doping effect could be introduced to the TMDs channel after the top dielectric deposition. [14,17] Under this circumstance, it is difficult to realize enhancement-mode (E-mode) field-effect transistors (FETs) with a positive threshold voltage (V T), which is essential for multistage cascaded circuits. [18] Therefore, for all previously reported electrical circuits based on CVD-synthesized MoS 2 , [9,10] the gate-first technique (gate electrodes are beneath dielectric layer and transferred MoS 2 layer) is utilized to avoid the n-doping via the top dielectric deposition on MoS 2 film. Nevertheless, the gate-first technique requires an extra film transfer process in the solution, which is more challenging and rather difficult for scaling up. Nowadays, utilization of new dielectric materials for emerging semiconductors has attracted much research attention. [19-30] For example, poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) as one of the most promising ferroelectric materials, has been used in ferroelectric memories and photodetectors based on 2DLMs. [29,30] It can provide an ultrahigh electrostatic field (nearly 10 9 V m −1) in the remnant polarization. But the ferroelectric material usually requires a high gate voltage (10-20 V) to effectively drive, which greatly limits its application in low-voltage electronics. On the other hand, electrolyte material could be an alternative candidate for nanoelectronics, which can commonly serve as a dielectric layer in the FET structure. Under a positive gate voltage, for example, cations in the electrolyte accumulate at the electrolyte/semiconductor interface, and correspondingly anions gather near the Electrolyte gating, based on the electric double-layer effect, has been widely used for 2D layered materials (2DLMs), since it is capable of inducing an ultrahigh charge-carrier density while requiring only a low gate voltage. However, the wafer-scale fabrication of high-performance field effect transistors (FETs) based on electrolyte gating remains challenging, due to the lack of an appropriate electrolyte film coating technique. Wafer-scale MoS 2 FETs gated by high-quality thin electrolyte film are demonstrat...