This paper studies the frequency tuning effect on the locking range property of a dual‐resonance 3:1 injection‐locked frequency divider (ILFD) fabricated in a foundry 0.18 μm BiCMOS process. The ILFD architecture is based on a capacitive cross‐coupled oscillator in conjunction with a resistor‐degraded dual‐resonance resonator for the locking range improvement. At a power consumption of 5.26 mW and at injection power of Pinj = 0 dBm the locking range from the measurement is from 6.2 to 12.6 GHz (68.09%). The frequency tuning range of the free‐running ILFD shows a frequency tuning hysteresis effect; at low input power level the locking range shows bipolar locking ranges and at high injection power the locking range is independent of the measured voltage tuning direction.