2010
DOI: 10.1134/s1063774510020033
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X-ray diffraction analysis of multilayer porous InP(001) structure

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Cited by 7 publications
(6 citation statements)
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“…Substituting expression (5) into formula (3) yields the following expression for the intrinsic correlation function of a prolate spheroid: (7) where ξ(ε, θ) = (1 -ε 2 cos 2 θ) 1/2 , θ is the polar angle between the z axis and vector ρ, and ε = (1 -(R/l z ) 2 ) 1/2 < 1 is the coefficient of ellipticity (eccentric ity) characterizing the shape of spheroids. For R = l z , we have ε = 0 and ξ(0, θ) = 1, so that expression (7) converts into the well known correlation function of a sphere of radius R [11].…”
Section: Diffuse X Ray Scattering From a Crystal With Spheroidal Poresmentioning
confidence: 99%
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“…Substituting expression (5) into formula (3) yields the following expression for the intrinsic correlation function of a prolate spheroid: (7) where ξ(ε, θ) = (1 -ε 2 cos 2 θ) 1/2 , θ is the polar angle between the z axis and vector ρ, and ε = (1 -(R/l z ) 2 ) 1/2 < 1 is the coefficient of ellipticity (eccentric ity) characterizing the shape of spheroids. For R = l z , we have ε = 0 and ξ(0, θ) = 1, so that expression (7) converts into the well known correlation function of a sphere of radius R [11].…”
Section: Diffuse X Ray Scattering From a Crystal With Spheroidal Poresmentioning
confidence: 99%
“…[3][4][5][6][7][8]. An important role in the distribution of diffuse scattering is played by the shape of pores.…”
mentioning
confidence: 99%
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“…Nevertheless, numerical simulation of diffuse scattering requires statistical averaging over QD vertical and lateral dimensions, as for porous crystals [128,129]. The size of self-organized QDs in a semiconducting matrix is known to be different, even if their volume variance is not very large.…”
Section: May 2015mentioning
confidence: 99%
“…The data evaluation was carried out by reciprocal space map (RSM) data fitting in the frame of the statistical dynamical diffraction model. The first systematic analysis of diffuse scattering from porous layers in InP was presented by Lomov et al (2006Lomov et al ( , 2010 and Punegov et al (2007). It was shown that high-resolution X-ray diffraction allows determination of the pore parameters, averaged over the sample volume.…”
Section: Diffuse X-ray Scattering From Porous Crystalline Layersmentioning
confidence: 99%