2018
DOI: 10.1016/j.tsf.2017.11.019
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X-ray diffraction and X-ray photoelectron spectroscopy characterization of sulfurized tin thin films deposited by thermal evaporation

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Cited by 4 publications
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“…23,24 The peak located at 162.8 eV could be assigned to the binding energies of the S 2− of SnS ( Figure 2C). 25,26 Further FTIR analysis were pursued in order to demonstrate that the tin and sulfur are transformed into SnS phase. Figure 2D shows the FTIR spectra of tin powder, sulfur powder, SnS 2 hours and SnS 20 hours samples that are different from each other resulting their characteristic peaks.…”
Section: Resultsmentioning
confidence: 99%
“…23,24 The peak located at 162.8 eV could be assigned to the binding energies of the S 2− of SnS ( Figure 2C). 25,26 Further FTIR analysis were pursued in order to demonstrate that the tin and sulfur are transformed into SnS phase. Figure 2D shows the FTIR spectra of tin powder, sulfur powder, SnS 2 hours and SnS 20 hours samples that are different from each other resulting their characteristic peaks.…”
Section: Resultsmentioning
confidence: 99%