2003
DOI: 10.1088/0022-3727/36/10a/334
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X-ray diffraction determination of the interface structure of CdSe/BeTe superlattices

Abstract: Structural study of CdSe/BeTe superlattices (SLs) grown by molecular beam epitaxy on GaAs substrate was performed by using double and triple crystal x-ray diffractometry. The period of the studied structures was about 5 nm, while the thickness of thin CdSe insertions varied from 0.4 to 1.5 monolayer. It is shown that new Be–Se bonds arise at the BeTe–CdSe interfaces in addition to the Be–Se bonds expected at the CdSe–BeTe interfaces. From the analysis of the diffraction curves of 002-reflection the complex com… Show more

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Cited by 5 publications
(3 citation statements)
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“…The CdSe/BeTe structures with the CdTe stressor interrupted at SSI maximum (type A) demonstrate typical ratio of CdTe to BeSe bond densities of ∼1/2 and noticeably asymmetric shape of the RCs, inherent for the structures with high residual stresses. More details have been published elsewhere [14].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The CdSe/BeTe structures with the CdTe stressor interrupted at SSI maximum (type A) demonstrate typical ratio of CdTe to BeSe bond densities of ∼1/2 and noticeably asymmetric shape of the RCs, inherent for the structures with high residual stresses. More details have been published elsewhere [14].…”
Section: Resultsmentioning
confidence: 99%
“…Structural properties of the CdSe/BeTe structures were studied by XRD [14] and TEM using a Philips EM-420 microscope at 100 kV. TEM cross-sectional images were taken using the (0 0 2) reflections chemically-sensitive for zinc blend cubic materials.…”
Section: Methodsmentioning
confidence: 99%
“…The CdSe/BeTe structures with the CdTe stressor interrupted at SSI maximum (type A) demonstrate typical ratio of CdTe to BeSe bond densities of ~1/2 and noticeably asymmetric shape of RCs, inherent for the structures with high residual stresses. More details have been published elsewhere [12].…”
Section: Resultsmentioning
confidence: 99%