2015
DOI: 10.1088/1674-1137/39/12/128001
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X-ray nanometer focusing at the SSRF based on a multilayer Laue lens

Abstract: We designed and fabricated a multilayer Laue lens (MLL) as a hard X-ray focusing device. WSi2/Si multilayers were chosen owing to their excellent optical properties and relatively sharp interface. The multilayer sample was fabricated by using direct current (DC) magnetron sputtering technology and then was sliced and thinned to form an MLL. The thickness of each layer was determined by scanning electron microscopy (SEM) image analysis with marking layers. The focusing property of the MLL was measured at Beamli… Show more

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Cited by 4 publications
(1 citation statement)
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“…Anhui province 2014 Fishes discriminant [18] Henan Province 2015 Feature ions-discriminant [19] Shanxi Province 2015 Support vector machine [20] Anhui compared to the linear algorithm. According to literature research, the ANN [27] and SVM [20] have been implement in this area.…”
Section: Coal Mine Districts Years Algorithm Sourcesmentioning
confidence: 99%
“…Anhui province 2014 Fishes discriminant [18] Henan Province 2015 Feature ions-discriminant [19] Shanxi Province 2015 Support vector machine [20] Anhui compared to the linear algorithm. According to literature research, the ANN [27] and SVM [20] have been implement in this area.…”
Section: Coal Mine Districts Years Algorithm Sourcesmentioning
confidence: 99%