In situ transient synchrotron Laue x-ray diffraction based on high-energy and broadband x rays under high strain-rate tensile loading was developed at a superconducting wiggler beamline at the Beijing Synchrotron Radiation Facility. A split-Hopkinson tensile bar is utilized to realize this dynamic loading condition, while the transient Laue x-ray diffraction captures the transient internal structure of monocrystalline materials. Plastic deformation of a monocrystalline nickel specimen was investigated to prove the ability of this instrumentation in the characterization of a dynamic response of monocrystalline materials during a high strain-rate impact process with 5 µs time resolution.

We designed and fabricated a multilayer Laue lens (MLL) as a hard X-ray focusing device. WSi2/Si multilayers were chosen owing to their excellent optical properties and relatively sharp interface. The multilayer sample was fabricated by using direct current (DC) magnetron sputtering technology and then was sliced and thinned to form an MLL. The thickness of each layer was determined by scanning electron microscopy (SEM) image analysis with marking layers. The focusing property of the MLL was measured at Beamline 15U, Shanghai Synchrotron Facility (SSRF). One-dimensional (1D) focusing resolutions of 92 nm are obtained at photon energy of 14 keV.

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