2020
DOI: 10.1364/oe.389940
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X-ray phase-sensitive imaging using a bilens interferometer based on refractive optics

Abstract: The phase-sensitive X-ray imaging technique based on the bilens interferometer is developed. The essence of the method consists of scanning a sample, which is set upstream of the bilens across the beam of one lens of the interferometer by recording changes in the interference pattern using a high-resolution image detector. The proposed approach allows acquiring the absolute value of a phase shift profile of the sample with a fairly high phase and spatial resolution. The possibilities of the imaging technique w… Show more

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Cited by 15 publications
(4 citation statements)
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“…2 Most of the investigations in X-ray biprism applications are using hard X-rays generated in synchrotrons. 3,[18][19][20][21] However, it has also found application to illustrate the wave-particle behavior in the singlephoton regime. 22,23 Bi-prisms have also been used in interference electron microscopy.…”
Section: Applications Of Bi-prism Interferometrymentioning
confidence: 99%
See 1 more Smart Citation
“…2 Most of the investigations in X-ray biprism applications are using hard X-rays generated in synchrotrons. 3,[18][19][20][21] However, it has also found application to illustrate the wave-particle behavior in the singlephoton regime. 22,23 Bi-prisms have also been used in interference electron microscopy.…”
Section: Applications Of Bi-prism Interferometrymentioning
confidence: 99%
“…Bi‐prisms have had many applications in the optical regime 2 . Most of the investigations in X‐ray bi‐prism applications are using hard X‐rays generated in synchrotrons 3,18–21 . However, it has also found application to illustrate the wave–particle behavior in the single‐photon regime 22,23 .…”
Section: Introductionmentioning
confidence: 99%
“…These interferometers use either the classical two-slit setup (pinholes) or two virtual sources (Leitenberger et al, 2001(Leitenberger et al, , 2004Yamazaki & Ishikawa, 2003;Leitenberger & Pietsch, 2007;Tsuji et al, 2009;Isakovic et al, 2010). Compound refractive lens (CRL) arrays for forming two or more interfering sources have also been used (Snigirev et al, 2009(Snigirev et al, , 2014Zverev et al, 2020). One of the difficulties with X-rays is the necessity for sufficiently large distances for overlapping the interfering beams.…”
Section: Introductionmentioning
confidence: 99%
“…2 Most of the investigations in X-ray biprism applications have used hard X-rays generated in synchrotrons. 3,[14][15][16][17] However, the use of biprisms has also found application to illustrate the wave-particle behaviour in the single-photon regime 18,19 and biprisms have also been used in interference electron microscopy. 20 Until 2003, 7 only Moiré fringe analysis produced by grating interferometry were used for extracting the properties of X-rays before mechanical phase stepping techniques.…”
mentioning
confidence: 99%