Articles you may be interested inModification of energy band alignment and electric properties of Pt/Ba0.6Sr0.4TiO3/Pt thin-film ferroelectric varactors by Ag impurities at interfaces Suppression of slow capacitance relaxation phenomenon in Pt/Ba0.3Sr0.7TiO3/Pt thin film ferroelectric structures by annealing in oxygen atmosphere Appl. Phys. Lett.The effects of ultraviolet ͑UV͒ irradiation on the relaxation processes in Ba 0.3 Sr 0.7 TiO 3 thin film capacitors were experimentally investigated in a range of wavelengths = ͑310-400͒ nm. It was observed that irradiation with a specific wavelength reduces the time of slow capacitance relaxation up to three orders of magnitude in comparison with relaxation time in the "dark" regime. It was also observed that at a certain wavelength of UV irradiation there was a maximum in the leakage current of the capacitors. This wavelength corresponded exactly with a minimum in the relaxation time of the capacitance. It was shown that the decrease in the ferroelectric film thickness resulted in a shift in ͑͒minima and I͑͒maxima towards the shorter wavelengths. Phenomena observed are analyzed using Bouguer's law.

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A method to evaluate the space charge trap energy levels in ferroelectric (FE) Ba0.3Sr0.7TiO3 film incorporated into a metal/FE/metal parallel plate capacitors structure is presented. It is based on microwave measurements of the capacitance relaxation time after the end of a dc pulse, when the change in measured capacitance is due to internal processes of space charge relaxation [Q(t)] in the FE film. Using the Q(t) dependencies obtained as a function of temperature, the time constants of slow relaxation processes were defined and the trap energy levels were evaluated as Et=0.7, 0.5, and 0.1 eV.

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