The article discusses algorithmic methods for ensuring the fault tolerance of the electronic component base (ECB). The protection methods used in regular and irregular structures are described. The essence of Hamming code algorithms, composite code, error correction and detection codes is revealed. The advantages and disadvantages of using arithmetic residual code, the method of redundancy at the level of program code fragments, are shown.

The problem of ensuring the stability of the electronic component base in the event of reversible single events and its solution by N-fold redundancy methods is considered. The paper presents a description, scheme, advantages and disadvantages of N-fold redundancy methods, such as duplication with a loaded backup element, various modifications of redundancy, sliding redundancy, and the use of a watchdog timer.

The article considers the issues of increasing the resistance of the electronic component base (ECB) to dose effects due to the improvement of the technological process. Graphs of the functions of the transfer characteristics of MOSFETs and CMOS inverters before and after radiation exposure are presented. The effect of the charge in the oxide and on the surface formed under the action of radiation is shown.

The analysis of information on the stability of the electronic component base (ECB) in the development of radio-electronic equipment (REE) of spacecraft (spacecraft) is an important and urgent task. The paper considers the main components of the approaches of foreign organizations developing radio space technology to ensure its radiation resistance. The design approaches of Thales Alenia Space, Airbus Defense and Space, and the European Space Agency are presented. The article outlines the main directions for optimizing the procedures for the preliminary selection of ECB, which consist in ensuring the required resistance of REE SC at the ECB level with ensuring the reliability of data on durability, in minimizing the costs of applying resistance enhancement measures (through the use of a promising ECB with increased resistance characteristics), to replace ECB.

The paper considers the requirements for test benches for studying the appearance of single radiation effects in the electronic component base (ECB) at elevated and low temperatures. Examples of the influence of the temperature regime on the levels of ECB stability, as well as the influence of the passive and active modes of radio-electronic equipment on the occurrence of single events are presented.