We describe a scanning time-of-flight system which uses the time-correlated single-photon counting technique to produce three-dimensional depth images of distant, noncooperative surfaces when these targets are illuminated by a kHz to MHz repetition rate pulsed laser source. The data for the scene are acquired using a scanning optical system and an individual single-photon detector. Depth images have been successfully acquired with centimeter xyz resolution, in daylight conditions, for low-signature targets in field trials at distances of up to 325 m using an output illumination with an average optical power of less than 50 microW.

This paper presents a new Bayesian model and algorithm used for depth and reflectivity profiling using full waveforms from the time-correlated single-photon counting measurement in the limit of very low photon counts. The proposed model represents each Lidar waveform as a combination of a known impulse response, weighted by the target reflectivity, and an unknown constant background, corrupted by Poisson noise. Prior knowledge about the problem is embedded through prior distributions that account for the different parameter constraints and their spatial correlation among the image pixels. In particular, a gamma Markov random field (MRF) is used to model the joint distribution of the target reflectivity, and a second MRF is used to model the distribution of the target depth, which are both expected to exhibit significant spatial correlations. An adaptive Markov chain Monte Carlo algorithm is then proposed to perform Bayesian inference. This algorithm is equipped with a stochastic optimization adaptation mechanism that automatically adjusts the parameters of the MRFs by maximum marginal likelihood estimation. Finally, the benefits of the proposed methodology are demonstrated through a series of experiments using real data.

This paper highlights a significant advance in time-of-flight depth imaging: by using a scanning transceiver which incorporated a freerunning, low noise superconducting nanowire single-photon detector, we were able to obtain centimeter resolution depth images of low-signature objects in daylight at stand-off distances of the order of one kilometer at the relatively eye-safe wavelength of 1560 nm. The detector used had an efficiency of 18% at 1 kHz dark count rate, and the overall system jitter was ~100 ps. The depth images were acquired by illuminating the scene with an optical output power level of less than 250 µW average, and using per-pixel dwell times in the millisecond regime.

We have used an InGaAs/InP single-photon avalanche diode detector module in conjunction with a time-of-flight depth imager operating at a wavelength of 1550 nm, to acquire centimeter resolution depth images of low signature objects at stand-off distances of up to one kilometer. The scenes of interest were scanned by the transceiver system using pulsed laser illumination with an average optical power of less than 600 µW and per-pixel acquisition times of between 0.5 ms and 20 ms. The fiber-pigtailed InGaAs/InP detector was Peltier-cooled and operated at a temperature of 230 K. This detector was used in electrically gated mode with a single-photon detection efficiency of about 26% at a dark count rate of 16 kilocounts per second. The system's overall instrumental temporal response was 144 ps full width at half maximum. Measurements made in daylight on a number of target types at ranges of 325 m, 910 m, and 4.5 km are presented, along with an analysis of the depth resolution achieved.