Functional tests and IDDQ tests are studied to determine their effectiveness toward screening failures. A model is presented for curve jitting correlation data between fault coverages and defect quality employing the Williams and Brown defect level to fault coverage equation. The model is used for multiple test types. Empirical data were gathered to demonstrate its effectiveness over functional and IDDQ tests. IDDQ test data demonstrates two categories of IDDQ defects: pattem sensitive and pattem insensitive defects.trade-off between functional and I D m tests for at least one ASIC technology.

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