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Abstract-A new on-chip Single Event Transient (SET) test structure has been developed that can autonomously measure the width of random SET pulses. Simulation results show measurement granularity of 900 ps for a 1.5 µm technology and 65 ps for 0.13 µm technology. Laser tests were used to obtain experimental data on test chips fabricated using 1.5 µm process. Experimental measurements show pulse widths varying from 900 ps to over 3 ns as the laser energy is increased.Index Terms-Single event transient (SET), transient pulse width

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