Compressive residual stresses are commonly introduced into the near-surface regions of morse taper junctions of modular hip endoprostheses to prolong fatigue life. An increasing number of publications report that contamination of shot-peened surfaces can lead to enhanced corrosion and third body wear. This study evaluates deep rolling of titanium alloy rods as a possible alternative to shot peening. Ten rods of Ti6Al7Nb alloy with a diameter of 15 mm were deep rolled with various rolling parameters. The resulting surface topography and residual contamination was analyzed using a scanning electron microscope (SEM). The near-surface residual stress states after deep rolling were characterized by means of X-ray diffraction. The roughness of the surfaces before deep rolling was about R(z) = 14 microm, and after deep rolling surface roughness values of R(z) 0.4-7.5 microm were achieved. The results of the SEM and EDAX analyses of the sample surface showed no evidence of surface contamination by particles or abrasion products caused by any process. At a pressure of 300 bar, compressive stress reached the maximum of -1150 MPa at a depth of 0.1 mm. Deep rolling thus allows a smooth and particle-free surface to be obtained and therefore shows promise as a surface treatment for mating surfaces of morse tapers in modular hip endoprostheses.
The residual stress state of brazed ceramic/metal compounds is described by means of X‐ray residual stress determinations and analytical calculations using a model of three elastic infinite plates. It is shown that the residual stress state of the soldered compound depends on the materials combination and on the geometrical conditions. The combination of X‐ray residual stress measurements and analytical calculations allows decisions on whether the assumption of a linear elastic model, based on elementary bending theory, is valid for the particular compounds.
X‐Ray Investigation of Stress States in materials
X‐ray stress analyses on crystalline or partially crystalline materials are based on the determination of elastic lattice strains which are converted to stresses by means of theory of elasticity. The development of the sin2Ψ‐method of X‐ray stress analysis and of diffractometers substituting film chambers during the 1960s initiated an enormcus progress in X‐ray stress analysis during the following three decades both in respect of the knowledge of the underlying principles and in respect of the practical application
This report sketches the historical development of X‐ray stress analyses and describes the actual state of the art of this important tool for materials science and engineering. Besides some important elements of X‐ray physics and theory of elasticity, experimental aspects of practical applications are outlined. Standard measuring procedures and special measuring problems are described and hints for practical solutions are given. In particular, examples of destructive and non‐destructive depth profiling of residual stresses, of residual stress analyses in thin coatings, in multilayer structures of thin coatings and in chemically graded coatings, of residual stress analyses in presence of textures, of residual and loading stress analyses in heterogeneous materials, in coarse grained, and in single crystalline materials are presented. The methods established up to now are explained and possible future developments are pointed out.
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