Abstract

No abstracts.

Studies of and experiences with the reduction of errors in test sieving are presented. The preparation of the test material and, above all, the errors in sample splitting are included in the considerations. Errors due to the manufacture of test sieves are discussed, for example the influence of the aperture width distribution. The method applied at the Forschungsinstitut für Aufbereitung (FIA) for the inspection and calibration of test sieves is described in detail. The use of test materials for the calibration of sieves is recommended.

No abstracts.

Energy loss nieasurements of fast electrons on GaAs yielded values for the plasma 0s-cillation, interband transitions and the dielectric function in the region 5 -30 ev. The results are discussed in comparison with literature statements. It is dealt especially with the influence of the degree of crystallinity of examined GaAs-films on the energy loss spectrum and the quantities derived from it.Energieverlustmessungon schneller Elektronen an GaAs lieferten Daten fur die Plasmaschwingung, Interbandubergiinge und die dielektrische Funktion im Bereich 5 -30 eV. Die Resultate werden im Vergleich niit Literaturangaben diskutiert. Besonders wird eingegangen auf den EinfluR des Kristallinitiitsgrades der untersuchten GaAs-Schichten auf das Energieverlustspektrum sowie die daraus abgeleiteten GroRen.