In this work, we describe an experimental setup in which an electric current is used to determine the angular velocity attained by a plate rotating around a shaft in response to a torque applied for a given period. Based on this information, we show how the moment of inertia of a plate can be determined using a procedure that differs considerably from the ones most commonly used, which generally involve time measurements. Some experimental results are also presented which allow one to determine parameters such as the exponents and constant of the conventional equation of a plate's moment of inertia.

This work presents a new alternative to studying and determining the shear or torsion modulus, G. For this purpose, a measuring system was constructed with a rotational motion sensor coupled to a torsion pendulum that allowed the determination of the angular position as a function of time. Through an equation derived from studies of mechanical spectroscopy and the theory of relaxation of materials, G was calculated, and experiments were focused on validating it. The advantage of this technique, compared to other dynamical methods, is that it is not necessary to know the Poisson's ratio of the sample.

The secondary electron emission of dielectrics usually is measured by the pulse method, in which the dielectric is irradiated with short pulses of electrons. Attempts to use a dynamic method, in which the dielectric is irradiated continuously, have failed because the dielectric becomes charged and this charge interferes with the emission process. The dynamic method can, however, be applied to metals where volume charges are prevented. This article reports dynamic measurements of the total secondary emission yield from stainless steel, platinum, and aluminum and compares them with results from the current pulse method. In order to apply the dynamic method to metals a simple but important change in the setup was introduced: a dielectric slab was placed between the electrode and the metallic sample, which permitted the sample surface potential and therefore the energy of the incident electrons to change continuously. Unlike for dielectrics, the emission curves for metals are identical when obtained by the two methods. However, for a sample with deliberately oxidized surfaces the total secondary emission yield is smaller when measured with the dynamic method as compared with the pulse method, just as happens for dielectrics.

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