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As multiport and differential VNA measurement needs move beyond 50 GHz, switching complications increase. PIN and FET switch insertion losses and costs increase enough that semi-complete test set switching fabrics are not always practical. In addition, system requirements may preclude optimal reference coupler placement. These issues lead to some complications with the traditional switch correction techniques used With the LRLiLRM class of calibrations. An approach based on a two-tier load match correction has been implemented to help handle the pathology of this test set type since some load match correction is considered hportant in many cases. When comparisons to traditional switch-corrected measurements are possible, the results are nearly identical. Single-ended and differential measurements to 65 GHz are presented to illustrate the technique. 141 0-7803-8858-5/05/$20.00~2005 IEEE

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