In-plane microresonators consisting of an Al x Ga 1Ϫx As heterostructure waveguide and deep etched cylindrical trenches give both out-of-plane and lateral-light confinement. The air trenches, acting as a Bragg reflector also allow diffraction into air, so that the far-field pattern reveals interesting information on the resonant cavity modes. By the use of a two-dimensional cylindrical model and a transfer-matrix method based on Hankel functions, the energy and angular dependences of the diffracted field are calculated and successfully compared to measurements.
Detuning between the emission line and the Fabry-Pérot wavelength is a critical parameter for microcavity light-emitting diode (MCLED) design with regard to the efficiency and emission directionality. We present here a method to measure simultaneously the detuning and the linewidth of the source emitter on the device itself. This method uses numerical simulations and a fitting procedure with the angular emission pattern measured on the MCLED. It is accurate, nondestructive and easy to implement.
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