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Yhir r e p r t was preprcd as an account of work Iponwrcd by tha Unitcd Strm w m m t . A brief description of each of the processes is given and detailed anaylses are made of the expected magnitudes of airborne effluent release rates from each system. The estimated release rates of the various processes are compared with present and anticipated regulatory limits. A number of recommendations are made for additional development studies to better understand and control certain airborne effluents from the solidification processes.Off-gas treatment systems are reviewed for high-temperature processes which are being developed for the solidification of high-level liquid wastes (HLLW) from nuclear fuel reprocessing plants. Brief descriptions of the individual processes and details of their off-gas systems are given in Section 2. Detailed analyses of the expected efficiencies of the individual systems for removing airborne radionuclide effluents generated by the processes are given in Section 3. A summary of the estimated feed-to-stack decontamination factors (DFs) for all the processes is given in Section 3.12.The maximum permissible concentrations (MPCs) for individual isotopes in air for uncontrolled areas as tabulated in 10CFR20 were compared with the recently established EPA standards (40CFR190), using the anticipated processing conditions: design fuel burnup, fuel cooled 1% years 'from reactor discharge; processing rate of 6 2/3 MTlDZ/day; and a dispersion factor, x / Q , from the stack to the site boundary of 1 x sec m-3. The results of the analysis show that the EPA release limits for a-emitting transuranics restricts the release rate of Cm-244 to some 3000 times less than that allowed by the 10CFR20 TfPCs. The new EPA regulations make Cm-244 the radionuclide for which the most stringent control is required in a waste solidification process. Assuming 10% of the maximum allowable fuel cycle release limit for a-emitting transuranics are allowed to become airborne in the waste solidifier stack gas, an estimated feed-to-stack DF of 9

The feasibility of achieving accurate, direct readout of the faradaic component in voltammetric techniques under conditions where nonfaradaic effects are substantial has been reinvestigated. Compensation of ohmic