Ion mobility spectrometry (IMS) has been used for over 30 years as a sensitive detector of organic compounds. The following is a brief review of IMS and its principles with an emphasis on its usage when coupled to mass spectrometry. Since its inception, IMS has been interfaced with quadrupole, time-of-flight, and Fourier-transform ion cyclotron resonance mass spectrometry. These hybrid instruments have been employed for the analysis of a variety of target analytes, including biomolecules, explosives, chemical warfare degradation products, and illicit drugs.
Articles you may be interested inHigh resolution quantitative two-dimensional dopant mapping using energy-filtered secondary electron imaging Secondary electron ͑SE͒ imaging of semiconductors reveals contrast between n-and p-type areas that can serve as the basis for a two-dimensional dopant profiling technique. In this article, recent experiments that address sensitivity, spatial resolution, calibration methodology, p/n junction effects, and sample preparation issues are reviewed and discussed for boron doped silicon. In addition, several examples of successful applications of SE imaging as a two-dimensional dopant profiling technique are presented.
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