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The precision measurement of the weak light pulse arrival time seems to be really important for various time-of-flight applications within the high energy physics and the medical imaging areas. Photon Detection Efficiency (PDE) and single photon Transit Time Spread (TTS) are considered to be the key characteristics for time resolution responsible photodetectors within such applications. The measurements of PDE and TTS are rather independent and require different techniques and setups. We consider the probability of single photon detection as a defective cumulative distribution function (CDF) of the single photon transit time, so a number of analytical expressions of how it can be reconstructed from the multi-photon TTS histogram affected by the dark counts have been found. It has allowed us to suggest a robust quantitative method of a single photon detection characterization provided with both single photon TTS and PDE. The method is considered to be especially relevant and useful for the Solid State Photomultipliers (SSPM) with high dark count rate.

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