The use of thin-film deposition in the fabrication of antireflection- coated diffractive optical elements is discussed. The antireflection coatings for these diffractive elements are optimized on the basis of an angular spectrum approach and the method of characteristic matrices. A minimum reflectivity as low as 1*10-4 is realized using in situ controlled multilayers of TiO2 and SiO2. The blazed profile of the diffractive optical elements is approximated by a stepped profile with up to 32 phase levels. The highest measured diffraction efficiency for 32-level Fresnel zone lenses was 97%
Blazed Fresnel zone lenses for the 1.5 mu m wavelength were fabricated in quartz glass by means of microstructuring technology. The blazed profile in each zone of the lenses was approximated by two, four, and eight discrete levels. The effects of fabrication errors, such as depth and alignment errors, on the diffraction efficiency of the different Fresnel zone lenses were investigated. Further the location and intensity of the parasitic foci appearing due to the discrete level approximation are calculated. Theoretical results along with experimental measurements are presented
Two-dimensional arrays of Fresnel zone microlenses were fabricated and coated with antireflection layers by an ion beam sputter deposition technique. The reflection of these lenses was analyzed on the basis of an angular spectrum approach for different substrate materials. A minimum reflectivity as low as 2*10-4 was realized by means of in situ controlled multilayers of TiO2 and SiO2. The lenses have a circular aperture of 2 mm and different focal lengths for the wavelengths of 1.52 and 0.63 mu m, respectively. The kinoform profile in each zone of the Fresnel zone lenses was approximated by an eight-level profile. Such stepped profiles were realized with several masks written with an electron beam and transferred by photolithographic technology. The measurements reveal that the spot sizes of the fabricated microlenses are close to the diffraction-limited values
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