The energy for data transfer has an increasing effect on the total system energy as technology scales, often overtaking computation energy. To reduce the power of interchip interconnects, an adaptive encoding scheme called Adaptive Word Reordering (AWR) is proposed that effectively decreases the number of signal transitions, leading to a significant power reduction. A novel circuit is implemented which exploits the time domain to represent complex bit transition computations as delays and, thus, limits the power overhead due to encoding. The effectiveness of AWR is validated in terms of decrease in both bit transitions and power consumption. AWR is shown to yield higher power savings compared to three state-of-theart techniques reaching 23% and 61% during the transfer of multiplexed address-data and image files, respectively, at just 1 mm wire length.
The energy for data transfer has an increasing effect on the total system energy as technology scales, often overtaking computation energy. To reduce the power of interchip interconnects, an adaptive encoding scheme called Adaptive Word Reordering (AWR) is proposed that effectively decreases the number of signal transitions, leading to a significant power reduction. AWR outperforms other adaptive encoding schemes in terms of decrease in transitions, yielding up to 73% reduction in switching. Furthermore, complex bit transition computations are represented as delays in the time domain to limit the power overhead due to encoding. The saved power outweighs the overhead beyond a moderate wire length where the I/O voltage is assumed equal to the core voltage. For a typical I/O voltage, the decrease in power is significant reaching 23% at just 1 mm.
Cryptographic circuits are sensitive to electromagnetic (EM) side-channel attacks (SCAs), which aim to detect the EM emissions of these circuits. A novel technique is proposed to mitigate such attacks, by reducing the correlation between the processed data and EM emissions. This objective is achieved by combining energy-efficient data inversion with dynamic delay insertion. The added delay enhances the immunity against EM attacks for the cryptographic circuit without performance degradation and, in specific scenarios, even improves performance. Simulation results on a set of EM traces, captured from an 8-bit interposer-based off-chip memory bus, demonstrate the efficiency of the proposed technique by decreasing SNR below 1 and improving the worst-case bus latency by 9.5%.
Application requirements along with the unceasing demand for ever-higher scale of device integration, has driven technology towards an aggressive downscaling of transistor dimensions. This development is confronted with variability challenges, mainly the growing susceptibility to time-zero and timedependent variations. To model such threats and estimate their impact on a system's operation, the reliability community has focused largely on Monte Carlo-based simulations and methodologies. When assessing yield and failure probability metrics, an essential part of the process is to accurately capture the lower tail of a distribution. Nevertheless, the incapability of widely-used Monte Carlo techniques to achieve such a task has been identified and recently, state-of-the-art methodologies focusing on a Most Probable Failure Point (MPFP) approach have been presented. However, to strictly prove the correctness of such approaches and utilize them on large scale, an examination of the concavity of the space under study is essential. To this end, we develop an MPFP methodology to estimate the failure probability of a FinFET-based SRAM cell, studying the concavity of the Static Noise Margin (SNM) while comparing the results against a Monte Carlo methodology.
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