Here, we develop a comprehensive reliability prediction of FPGA devices from data motivated by physics of failure. The Multiple Temperature Operational Life (MTOL) testing method was used to calculate the failure in time (FIT) of 3 different mechanisms on both 45 nm and 28 nm technologies. We confirmed that there is significant hot carrier injection (HCI) at sub-zero temperatures in 45 nm technology. Surprisingly, we found that 28 nm exhibits no HCI degradation even with up to 1.6 V on the core. As a result, we show that there is no effect of frequency on the reliability. This means that at 28 nm and possibly smaller technologies, the devices can be de-rated or up-rated based only on the NBTI model and therefore reliability is dependent only on operating Voltage and Temperature with a single activation energy. Notably, the activation energies and voltage acceleration factors for both technologies are remarkably similar. This demonstration shows that, unlike other conventional qualification procedures, the MTOL testing procedure gives a broad description of the reliability from sub-zero to high temperatures. This procedure provides FIT prediction which can be applied to newer technologies, specifically 20 nm and 16 nm and beyond.

Induction or asynchronous AC motors are widely used in the electromechanical industries. However, the selection of an appropriate motor for specific drive applications represents a non-trivial task. The most effective and universally accepted method is to use equivalent T-circuit for this purpose. Parameter determination of equivalent circuit should be done relatively fast and accurately. This article describes a novel and simplified method for the estimation of equivalent circuit parameters, which is exclusively based on the manufacturer's datasheet. The proposed method is based on the synergetic interaction between the numerical and analytical dimensionless approach using the Thevenin theorem. Initially, rated motor parameters and unknown variables of the equivalent circuit are combined into dimensionless expressions using the Thevenin approach. This method is simple, original, and useful to prevent instability in the numerical solution. Importantly, the high convergence of a solution and relatively fast calculation of parameters reveals the significant novelty of the proposed method. This method provides accurate and sustainable results for a wide range of low voltage asynchronous motors with different rotational velocities, torque, and power range from a few to hundreds of kilowatts. The proposed method is validated by the application of three types of asynchronous AC motors.

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Here a solution for a Microchip Health Monitoring (MHM) system using MTOL (Multi-Temperature Operational Life) reliability testing assessment data is proposed. The module monitors frequency degradation over time compared to lab tested data. Since trends in performance degradation in recently developed devices have transitioned from multiple failure mechanisms to a single dominant failure mechanism, development of the monitor is greatly simplified. The monitor uses a novel circuit customized to deliver optimum accuracy by combining the concepts of ring oscillator (RO) and phase locked loop (PLL) circuits. The modified circuit proposed is a new form of the frequency locked loop (FLL) circuit. We demonstrate that the collection of frequency degradation data from the ring circuits of each test produces Weibull distributions with steep slopes. This implies that the monitor can predict accurate end-of-life (EOL) predictions at early stages of chip degradations. The design of the microchip health monitoring system projected in this work can have great benefit in all systems using FPGA and ASIC devices.