One of the most often mentioned advantages of back-junction back-contacted silicon solar cells is that this cell structure has no shading losses, because metallization fingers and busbars are both located on the rear side of the solar cell. However, this is only true if only optical shading losses are regarded. In this work electrical shading losses due to recombination in the region of base busbar and fingers are analyzed using two-dimensional numerical device and network simulations. The base doping dependence of these effects is investigated as well as the influence of the rear side passivation. The results of the simulations are compared with EQE maps of back-junction solar cells. The influence of the busbars is quantified and the influence on the overall cell performance is discussed

In this study, short-circuit current losses in high-efficiency n -type back-contacted back-junction silicon solar cells caused by the electrical shading effect have been investigated by two-dimensional simulations of the charge carrier collection probability. Based on the reciprocity theorem, the homogenous partial differential equation describing the probability of charge carriers being collected by the p-n junction on the rear side of the solar cell has been solved numerically using the finite element method implemented in the partial differential equation solver COMSOL Multiphysics. The method has been applied to study the impact of geometrical parameters of the solar cell, such as the pitch distance, as well as the emitter and back surface field width, on the local and global internal quantum efficiency and on the short-circuit current density. The influence of the rear surface recombination velocity of an undiffused gap and the effective rear surface recombination velocity of the back surface field region on the short-circuit current density is also presented. It has been found that the width and the surface recombination velocity of the undiffused gap on the rear side of the solar cell have a strong impact on the charge collection probability in the base. Thus, the surface recombination velocity of the undiffused gap has to be minimized or the undiffused gap has to be reduced or omitted completely in order to increase the short-circuit current density significantly. Furthermore, it has been found that low base doping concentrations are essential for minimizing the effective rear surface recombination velocity of the back surface field. It has also been shown that in the case of low base doping concentrations, the short-circuit current density reaches its maximum value and that in this case it is nearly independent of the back surface field doping concentration

A technique for field effect surface passivation for silicon solar cells Appl. Phys. Lett.

The determination of the emitter saturation current density J0e of symmetrical test structures, analyzed by injection‐dependent lifetime spectroscopy (IDLS), in high as well as in low injection regimes is compared. A detailed investigation of the influence of different models for the Auger recombination on the evaluation of the measured minority carrier lifetime is performed. It can be concluded that a good agreement for the extraction of J0e under high and low injection conditions for lightly and highly doped emitters on textured and untextured surfaces was obtained if the Auger parameterization of Kerr et al. is applied. For deep‐diffused emitter profiles on textured surfaces a significant increase of J0e well above the geometrical surface area ratio of untextured and textured surfaces of 1.7 was observed. A verification of the experimentally determined values for J0e is performed by numerical device simulations. The simulated surface recombination velocity for the investigated emitter doping profiles is in good agreement to analytical calculations. Copyright © 2010 John Wiley & Sons, Ltd.

N‐type back‐contact back‐junction solar cells were processed with the use of industrially relevant structuring technologies such as screen‐printing and laser processing. Application of the low‐cost structuring technologies in the processing of the high‐efficiency back‐contact back‐junction silicon solar cells results in a drastic increase of the pitch on the rear cell side. The pitch in the range of millimetres leads to a significant increase of the lateral base resistance. The application of a phosphorus doped front surface field (FSF) significantly reduces the lateral base resistance losses. This additional function of the phosphorus doped FSF in reducing the lateral resistance losses was investigated experimentally and by two‐dimensional device simulations. Enhanced lateral majority carrier's current transport in the front n+ diffused layer is a function of the pitch and the base resistivity. Experimental data show that the application of a FSF reduces the total series resistance of the measured cells with 3.5 mm pitch by 0.1 Ω cm2 for the 1 Ω cm base resistivity and 1.3 Ω cm2 for the 8 Ω cm base resistivity. Two‐dimensional simulations of the electron current transport show that the electron current density in the front n+ diffused layer is around two orders of magnitude higher than in the base of the solar cell. The best efficiency of 21.3% was obtained for the solar cell with a 1 Ω cm specific base resistivity and a front surface field with sheet resistance of 148 Ω/sq. Copyright © 2008 John Wiley & Sons, Ltd.