2011
DOI: 10.1063/1.3524506
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Investigation of electrical shading effects in back-contacted back-junction silicon solar cells using the two-dimensional charge collection probability and the reciprocity theorem

Abstract: In this study, short-circuit current losses in high-efficiency n -type back-contacted back-junction silicon solar cells caused by the electrical shading effect have been investigated by two-dimensional simulations of the charge carrier collection probability. Based on the reciprocity theorem, the homogenous partial differential equation describing the probability of charge carriers being collected by the p-n junction on the rear side of the solar cell has been solved numerically using the finite element method… Show more

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Cited by 65 publications
(40 citation statements)
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“…The same effect is also demonstrated in a back-contacted diffused 2421 junction solar cell [359]. Fill factor increases along with emitter coverage up to a certain 2422 value and then decreases because of the increased series resistance related to the longer travel Fig.…”
supporting
confidence: 51%
“…The same effect is also demonstrated in a back-contacted diffused 2421 junction solar cell [359]. Fill factor increases along with emitter coverage up to a certain 2422 value and then decreases because of the increased series resistance related to the longer travel Fig.…”
supporting
confidence: 51%
“…Conversely, the IBC-SHJ device FF is 73.0%, which is significantly lower than any typical high-performance Std-SHJ device. Based on spectral response and light-beam-induced current measurements, we link the still relatively modest J sc gain in our IBC-SHJ devices (versus our best Std-SHJ device) to not fully minimized parasitic absorption losses (both in the short-and long-wavelength parts of the spectrum), rather than to electrical shading effects [30], [31]. Further details on this topic will be the subject of future research.…”
Section: A Interdigitated Back-contacted Silicon Heterojunction Solamentioning
confidence: 99%
“…In our case, it seems reasonable to consider 0.5-mm-wide electron-collecting stripes as a practical limit for our process flow. Alternatively, as the electrical shading is also dependent on the surface-passivation level of the electron-collecting regions [33], it can be reduced by enhancing the passivation quality in our IBC-SHJ devices. To which quantitative extent these two levers will allow mitigating J medium still needs to be investigated.…”
Section: A Breakdown Of Short-circuit Current Losses: Two-side Contamentioning
confidence: 99%