Nanoplastic particles (NPs) are ubiquitously
present in the environment
and their potentially harmful effects on ecological systems remain
largely unknown. Owing to their minute spatial dimensions, both the
identification and characterization of NPs represent major challenges.
In this work, two scanning probe microscopy-based procedures are established.
Conventional atomic force microscopy (AFM) is applied with commercially
available pyramidal tips to assess the surface topography as well
as the nanoscale deformation and adhesion of individual intentionally
synthesized NPs. In addition, these NPs are fastened to the modified
tip apex of AFM cantilevers via advanced nanomanipulation to form
colloidal probes, allowing the adhesion and friction behavior of entire
NPs to be studied on well-defined substrates with unprecedented resolution.
In this way, the nanoscale properties of an NP can be correlated with
its particle-scale adhesion and friction behavior. This methodology
thus promises to gain new insight into the complex surface-related
interactions of NPs and can be applied to the study of NPs originating
from the breakdown of plastic debris within the environment.
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