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The tolerance to the cumulative effects of ionizing radiation is one of the most important parameters to keep into account when selecting an EEE component for space applications. TID sensitivity is normally investigated measuring changes induced by gamma rays from 60 Co sources to nominal parameters of a component or to its expected functional behavior. In this work we propose an on-chip 90 Sr/ 90 Y electron source as an alternative methodology for TID tests. 60 Co and 90 Sr/ 90 Y TID test setups for a complex SoC are compared in terms of complexity and of experimental results, investigating the use of a 90 Sr/ 90 Y as well as the established 60 Co. We show that 90 Sr allows a simpler test setup, manages to reproduce specific modes of failure obtained with 60 Co and causes failures at comparable total doses. This makes 90 Sr an interesting alternative to 60 Co qualification and the use of untested components, to be further investigated especially for complex COTS SoCs.

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