Monitoring the state of the optical network is a key enabler for programmability of network functions, protocols and efficient use of the spectrum. A particular challenge is to provide the SDN-EON controller with a panoramic view of the complete state of the optical spectrum. This paper describes an architecture for compact on-chip spectrometry targeting high resolution across the entire Cband to reliably and accurately measure the spectral profile of WDM signals in fixed and flex-grid architectures. An industry standard software tool is used to validate the performance of the spectrometer. The fabrication of the proposed design is found to be practical.

In this work we have theoretic layer waveguide placing a magnetic metam Positive (DPS) material and then implemente substrate for microstrip patch antenna and reduction. This patch antenna operates at th and the radiation gain at each band is moderate bandwidth of each band. These b applications in WLAN and WiMAX devices. tuning is possible in this antenna.Index Terms-Bi-layer waveguide, magne triple-band, size reduction.

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A panoramic ultra-high resolution photonic integrated circuit spectrometer is under development by the authors. The architecture comprises a tunable ring resonator (RR) stage and an AWG stage. The resolution defines the bandwidth of the RR, determined by the cross-coupled power and hence the gap between the access and ring waveguides. The AWG channel frequency spacing determines the required free-spectral range (FSR) and hence the perimeter of the ring resonator. The specified <1 GHz resolution combined with an FSR of 50 GHz renders accurate simulation difficult, obstructing the design process. In this report, a simplified design rule to determine the minimum gap between straight access waveguides and a circular ring waveguide is proposed. Realistic assumptions such as the existence of local bisymmetry and adiabatic mode evolution throughout the coupling region permit a simple mode solver to determine the relationship between the cross-coupled power and the minimum gap size. A parameter extraction method is also formulated for add-drop rings equipped with two nominally identical couplers that disentangles the loss and coupling ring parameters from intensity-only transmission measurements. The proposed rule is applied to the design of ring resonators fabricated on a Si3N4 platform. The parameter extraction method is used to analyze the measured characterization data of the ring resonators. The results show good agreement within ~43 nm between the design rule and the gaps size determined by the parameters extracted from the measured data and provide experimental confirmation of the technological viability of the ring resonators required by the spectrometer.

A photonic implementation of a wavelength meter typically applies an interferometer to measure the frequency-dependent phase shift provided by an optical delay line. This work shows that the information to be retrieved is encoded by a vector restricted to a circular cone within a 3D Cartesian object space. The measured data belong to the image of the object space under a linear orthogonal map. Component impairments result in broken orthogonal symmetry, but the mapping remains linear. The circular cone is retained as the object space, which suggests that the conventional conic section fitting for the wavelength meter application is a premature reduction of the object space from R3 to R2. The inverse map, constructed by a learning algorithm, compensates impairments such as source intensity fluctuation and errors in delay time, coupler transmission, and photoreceiver sensitivity while being robust to noise. The simple algorithm does not require initial estimates for all parameters except for a broad bracket of the delay; further, weak nonlinearity introduced by uncertain delay can be corrected by a robust golden search algorithm. The phase-retrieval process is invariant to source power and its fluctuation. Simulations demonstrate that, to the extent that the ten parameters of the interferometer model capture all significant impairments, a precision limited only by the level of random noise is attainable. Applied to measured data collected from a fabricated Si3N4 wavelength meter, greater than an order of magnitude improvement in precision compared with the conventional method is achieved.