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This paper provides a global overview of the radiofrequency (RF) performance potential of carbon-nanotube field-effect transistors (CNFET), which for the first time includes the impact of noise. We develop noise and manufacturing process variability extensions for the Stanford CNFET compact model, implemented in Verilog-A and compatible with conventional circuit simulators. CNFET figures-of-merit (FoM) are determined both on the device and on the circuit level. Compared to silicon technology, CNFET devices show much better performance in terms of most of the RF-CMOS requirements of the International Technology Roadmap for Semiconductors. FoM projections for basic RF building blocks (low-noise amplifier and oscillator) show that good performance can already be obtained with simple circuit topologies. The main advantage of CNFET circuits yet lies in easily reaching operation frequencies of several hundreds of gigahertz, which are hard to be exploited by silicon technologies at similar technology nodes.Postprint (published version

This paper focuses on the development of a compact noise model for radiofrequency (RF) carbon nanotube field-effect transistors (CNFET). The noise mechanisms in these devices are discussed and the impact of the different noise sources is analyzed. For the RF-CNFET under investigation a mínimum noise figure NFmin = 0.104 dB at 60 GHz is predicted. Our model is usable with conventional circuit simulators, which provides a basis for further investigations on CNFET-based RF Building blocks.Peer ReviewedPostprint (published version

This work focuses on process variability and noise in carbon nanotube field-effect transistors (CNFET) to obtain a compact model usable for radiofrequency (RF) design and simulations. CNFET figures of merit (FoM) are determined and compared to International Technology Roadmap for Semiconductors (ITRS) requirements on conventional analog silicon-based devices. The developed model is also used to investigate on the impact of manufacturing process variability on the CNFET's RF-performance and noise behavior.