Many mid-infrared semiconductor laser sources are now being developed with superlattice active regions. Calculations of gain, index of refraction, and intervalence subband absorption for these laser materials require accurate subband energies, wave functions, and radiative matrix elements. We have recently begun using a solution method based on the empirical pseudopotential method (EPM). This method shows particular strength in analyzing structures with short periods or thin layers, for which the standard method, based on k⋅p perturbation theory and the envelope function approximation, may be problematical. We will describe the EPM applied to bulk solids and then demonstrate our direct generalization of the method for applications to superlattice structures. Calculations for recently developed mid-infrared semiconductor lasers using type-II superlattice active regions will be used to illustrate the method.

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We describe the molecular-beam epitaxy growth, as well as both the structural and optical characterization of a set of InAs/GaSb type-II strained-layer superlattice samples, in which the GaSb layer thickness is systematically increased. Absorbance spectroscopy measurements show well-defined features associated with transitions from the various valence subbands to the lowest conduction subband, and also a significant blueshift of the band edge when the GaSb layers thickness is increased. Empirical pseudopotential method calculations are shown to successfully predict the blueshift and help identify the higher-energy transitions.

We report on optically pumped semiconductor lasers emitting near 3.8 μm that exhibit high power and low output divergence. The lasers incorporate multiple InAs/InGaSb/InAs type-II wells imbedded in an InGaAsSb waveguide that is designed to absorb the pump emission. When operated at 85 K, 0.25 mm×2.5 mm broad area devices produce >5 W of peak power under long pulse conditions. Moreover, these extremely bright devices exhibit a fast axis divergence of only ∼15° full width at half maximum (FWHM), coupled with a slow axis divergence of ∼6° FWHM. The first is due to the reduced optical confinement in the transverse direction, while the latter is attributed to the suppression of filament formation, which is another beneficial consequence of the low optical confinement.

We describe the photoluminescence spectroscopy (PL) and Fourier transform infrared absorbance spectroscopy characterization of a large set of InAs/GaSb type-II strained layer superlattice (SLS) samples. The samples are designed to probe the effect of GaSb layer thickness on the optical properties of the SLS, while the InAs-layer thickness is held fixed. As the GaSb layer thickness is increased, we observe a spectral blue shift of the PL peaks that is accompanied by an increase in intensity, narrower linewidths, and a large reduction in the temperature sensitivity of the luminescence. These effects occur despite a significant reduction in the electron-hole wave function overlap as the GaSb layer thickness is increased. In addition, we compare the results of empirical pseudopotential model (EPM) calculations to the observed blueshift of the primary band gap. The EPM calculations are found to be in very good agreement with the observed data.