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Solid‐state dewetting of continuous Ni films deposited on the (111) surface of yttrium‐stabilized zirconia (YSZ) was used to produce equilibrated Ni particles, and the solid–solid interface structure was determined using aberration‐corrected transmission electron microscopy. The ~150 nm thick Ni films were annealed at 1350°C in Ar + H2 (99.9999%) at a partial pressure of oxygen of 10−20 atm for 6 h. Transmission electron microscopy of equilibrated particles, which was conducted to analyze the structure at the interface, revealed that despite the 31% lattice mismatch between Ni and YSZ, the interface is semicoherent and a two‐dimensional network of misfit dislocations was identified.

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